CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE - Information about the patent

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE
  • Status: Solicitud publicada
  • Country: Spain
  • Filing date: 28/01/2020
  • Request number:

    E20154134

  • Publication number:

  • Grant date:
  • Inventors:
    NEMOTO, Yoshikazu
    MURAKAMI, Yuta
    MAEDA, Takakuni
    ABE, Akira
    KAWAMOTO, Masatsugu
    MEZAKI, Hiroki
  • Information of the applicant:
    Jeol Ltd.
  • Information of the representative:

  • International Patent Classification:
    H01J 37/20,H01J 37/22,H01J 37/28
  • Publication's International Patent Classification:
    H01J 37/20,H01J 37/22,H01J 37/28
  • Expiration date:

European patent for "CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE"

This application has been made by

JEOL LTD.

The products and services protected by this patent are:
H01J 37/20 - H01J 37/22 - H01J 37/28

Publications:
EP3693989 (12/08/2020) - A1 Solicitud de patente europea con informe de búsqueda en la OEP

Events:
On the date 12/08/2020 Publicación OEP Solicitud de Patente Europea con Informe de Búsqueda (A1) took place


Information source:
Some of the information published here is public since it has been obtained from the Industrial Property Office of the different countries on 31/08/2020 and therefore the information may not be up to date.

Some of the information shown here has been calculated by our computer system and may not be true.
Privacy:
If you consider that the information published here affects your privacy and you want us to delete the information published here, send an email to info@patentes-y-marcas.com or fill out the form that you will find here.

Information on the registration of european patent by CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134

The registration of european patent by CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134 was requested on the 28/01/2020. It is a record in Spain so this record does not offer protection in the rest of the countries. The registration CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134 was requested by JEOL LTD.. The registration of [modality] by CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134 is classified as H01J 37/20,H01J 37/22,H01J 37/28 according to the international patent classification.

Other inventions requested by Jeol Ltd.

It is possible to know all the inventions requested by Jeol Ltd., among which is the record of european patent by CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134. If you want to know more inventions requested by Jeol Ltd. click here.

Other inventions requested in the international patent classification H01J 37/20,H01J 37/22,H01J 37/28.

It is possible to know inventions similar to the field of the technique concerned. The registration of european patent by CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134 is classified with the classification H01J 37/20,H01J 37/22,H01J 37/28 so if you want to know more records with the classification H01J 37/20,H01J 37/22,H01J 37/28 click here.

Patents in Spain

It is possible to know all the inventions published in Spain, among which the registration european patent by CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE. Our website www.patentes-y-marcas.com offers access to patent publications in Spain. Knowing the patents registered in a country is important to know the possibilities of manufacturing, selling or exploiting an invention in Spain.

Registered patents in class H

It is possible to know all the patents registered in class H (ELECTRICITY) among which is the patent CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134. Knowing the patents registered in a class is important to know the possibilities of registering a patent in that same class.

Registered patents in class H01

It is possible to know all the patents registered in class H01 (BASIC ELECTRIC ELEMENTS) among which is the patent CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134. Knowing the patents registered in a class is important to know the possibilities of registering a patent in that same class.

Registered patents in class H01J

It is possible to know all the patents registered in class H01J (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ) among which is the patent CHARGED PARTICLE BEAM SYSTEM AND METHOD OF MEASURING SAMPLE USING SCANNING ELECTRON MICROSCOPE with the number E20154134. Knowing the patents registered in a class is important to know the possibilities of registering a patent in that same class.